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ISL28195FHZ-T7
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Product Detailed Parameters
- Description：IC OPAMP GP 1 CIRCUIT 6SOT
- Series：-
- Mfr：Intersil
- Package：Bulk
- Amplifier Type：General Purpose
- Number of Circuits：1
- Output Type：Rail-to-Rail
- Slew Rate：0.0042V/µs
- Gain Bandwidth Product：10 kHz
- Current - Input Bias：15 pA
- Voltage - Input Offset：100 µV
- Current - Supply：1µA
- Current - Output / Channel：12 mA
- Voltage - Supply Span (Min)：1.8 V
- Voltage - Supply Span (Max)：5.5 V
- Operating Temperature：-40°C ~ 125°C
- Grade：-
- Qualification：-
- Mounting Type：Surface Mount
- Package / Case：SOT-23-6
- Supplier Device Package：6-SOT
- -3db Bandwidth：-
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Buying Guide
Intersil ISL28195FHZ-T7 is selected in Instrumentation, Op Amps, Buffer Amps category when gain/offset/noise margins must hold across temperature and production variance. Key specs include Description (IC OPAMP GP 1 CIRCUIT 6SOT), Output type (Rail-to-Rail), Temperature (-40°C ~ 125°C), Package/case (SOT-23-6), and Mounting (Surface Mount).
Selection Notes
- For ISL28195FHZ-T7, confirm the operating temperature range (-40°C ~ 125°C) meets your deployment conditions.
- Confirm Current - Input Bias (15 pA) is suitable for your use case and operating conditions.
- Confirm the mounting type (Surface Mount) matches your assembly process and reliability requirements.
Alternates & Substitutions
- For ISL28195FHZ-T7, candidates that keep bandwidth 10 kHz and slew rate 0.0042V/µs aligned usually stay closest to the original signal-chain behavior.
- For ISL28195FHZ-T7, the strongest alternatives usually keep bandwidth 10 kHz and slew rate 0.0042V/µs aligned at the same time, because matching only one headline number rarely preserves the whole product role (key constraints: package SOT-23-6, interface Rail-to-Rail).
- In Instrumentation, Op Amps, Buffer Amps designs, a practical second source is usually the option that changes the fewest assumptions in layout, firmware, or mating hardware.
- Good substitutes normally keep the visible function unchanged and move any trade-off into margins your design already has.
FAQ
How do I validate ISL28195FHZ-T7 in my design?
Verify stability under your expected capacitive load, confirm the common-mode voltage range, and check output swing limits.
Which Voltage - Input Offset is listed for ISL28195FHZ-T7?
100 µV
Can you confirm the Number of Circuits for ISL28195FHZ-T7?
1
What package type does ISL28195FHZ-T7 come in?
SOT-23-6
Application Scenarios
In many Instrumentation, Op Amps, Buffer Amps builds, Intersil ISL28195FHZ-T7 is reviewed for measurable behavior on the board, realistic validation effort, and long-term supply continuity. Engineers generally pay close attention to grounding, references, interface timing, and loading so end-to-end performance is preserved on the PCB. Teams typically verify grounding, reference integrity, interface timing, and loading because small errors compound across the chain. In harsh environments, in-amps help reject ground shifts and common-mode noise introduced by motors, contactors, and cable routing. In data acquisition front ends, in-amps provide precise gain before conversion when channel matching and repeatability across production units are required. Instrumentation amplifiers are chosen around CMRR, input offset/drift, noise, and input protection when long cables and ground shifts are present. This is how teams keep performance stable without adding unnecessary complexity to the rest of the design.
Compatibility Advice
- With Intersil ISL28195FHZ-T7, confirm voltage-level compatibility and default states so reset behavior is deterministic across connected devices. This reduces the chance that a substitute only works under a friendlier bench setup than the shipped product will ever see.
- In practice, validate timing margins, skew, and edge quality on the real routing so data integrity is repeatable across temperature on the assembled PCB.
Project Fit
- Intersil ISL28195FHZ-T7 is worth shortlisting for Instrumentation, Op Amps, Buffer Amps when the team can you can validate the key assumptions on the assembled system and keep the acceptance criteria tied to the real test method.
